Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms by Jozef Veselý

Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms by Jozef Veselý

Author:Jozef Veselý
Language: eng
Format: epub
Publisher: Springer International Publishing, Cham


3.7 Transmission Electron Microscopy

Ernst Ruska’s early experiments with focusing of writing spot of cathode-ray oscillographs eventually lead to the development of electron microscope. It was known that the resolution of optical microscopes is limited by wavelength of light and Ruska “simply hoped for extremely low dimensions of electrons” [44]. When he became aware of De Broglie’s work he was indeed satisfied by wavelength of electrons being five orders of magnitude shorter than that of light. Since than the electron microscopy became a major tool in both life and material sciences.



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