Cooling Electrons in Nanoelectronic Devices by On-Chip Demagnetisation by Alexander Thomas Jones

Cooling Electrons in Nanoelectronic Devices by On-Chip Demagnetisation by Alexander Thomas Jones

Author:Alexander Thomas Jones
Language: eng
Format: epub
ISBN: 9783030512330
Publisher: Springer International Publishing


We see in Fig. 3.14 that this thermal model provides a reasonable fit to the measured electron temperatures, and hence gives us an understanding of how the nuclear temperature evolves during the demagnetisation. There is a very small deviation of the measured data from the model at the lowest temperature part of the demagnetisation, where the model predicts a lower electron temperature than is actually observed. This may be the result of electrical noise causing broadening of the conductance curve (Fig. 3.5) and hence raised electron temperature measurements. The fitting parameter which controls the relative strength of the electron-phonon coupling, by setting the effective volume that this operates over, is surprisingly low at of the volume used for the calculation of and (via the number of moles n). This may be accurate for the electroplated copper, particularly if this copper takes a form with a grain size smaller than the mean free path for phonon-electron collisions [30, 31]. Alternatively, this parameter may be forced to take a somewhat unphysical value if the phonon temperature does not rise linearly as we assume here, or if there is a significant deviation from the dependence for the electron-phonon coupling, as has been seen in other devices [2, 32]. This model was additionally fitted to four other demagnetisations performed at different rates, and a close agreement between the measured and modelled values was found for all cases.



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