Structural Characterisation of Natural and Industrial Porous Materials: A Manual by Sean Patrick Rigby

Author:Sean Patrick Rigby
Language: eng
Format: epub
ISBN: 9783030474188
Publisher: Springer International Publishing

(5.14)

where s is the spot size of the X-ray source, d is the pixel size, and M is the magnification. The magnification is given by (Cnudde et al. 2011):

(5.15)

Hence, the sample size potentially limits the resolution by determining the upper limit for the distances possible in Eq. (5.15). Laboratory micro-CXT equipment can achieve resolution down to ~100s nanometres. Higher resolutions can be achieved on synchrotrons, but the availability is limited. In general, the resolution is limited at low magnification by the detector pixel size, while, at higher magnifications, the X-ray spot size becomes limiting.

Fig. 5.2Schematic depiction of the principles of computerised X-ray tomography

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