Raman Spectroscopy for Determination of Silicon Oxyfluoride Structure in Fluoride Melts by Yuta Suzuki & Taebyung Park & Kan Hachiya & Takuya Goto

Raman Spectroscopy for Determination of Silicon Oxyfluoride Structure in Fluoride Melts by Yuta Suzuki & Taebyung Park & Kan Hachiya & Takuya Goto

Author:Yuta Suzuki & Taebyung Park & Kan Hachiya & Takuya Goto
Format: pdf
Tags: Fluoride melts, Raman spectroscopy, Silicon, Coordination structure
Publisher: Elsevier
Published: 2020-09-28T22:07:56+00:00


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