System-on-Chip Test Architectures: Nanometer Design for Testability by Touba Nur

Author:Touba, Nur...
Language: eng
Format: epub
Published: 2014-05-22T17:39:51.258000+00:00

7.2

(Test Power Reduction) List three ad hoc solutions for reducing power consumption during test application, and show the advantages and disadvantages of each solution.

7.3

(Terminology) Explain the difference between dynamic power, short-circuit power, and leakage power.

7.4

(Terminology) Explain the difference between energy and power. Also explain what the following terms mean: average power, instantaneous power, and peak power.

7.5

(Test Power Evaluation) Show the equations for estimating average power, instantaneous power, and peak power. Explain all the parameters used in the equations.

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