Circadian Rhythms for Future Resilient Electronic Systems by Xinfei Guo & Mircea R. Stan

Circadian Rhythms for Future Resilient Electronic Systems by Xinfei Guo & Mircea R. Stan

Author:Xinfei Guo & Mircea R. Stan
Language: eng
Format: epub
ISBN: 9783030200510
Publisher: Springer International Publishing


The design has been implemented in a 28 nm FD-SOI technology. Figure 4.24 is the layout for a 37-stage ring oscillator that is implemented with the sensing element discussed above. The overall area is about 92 μm2, and it is only ∼1.6 × larger than the same RO configuration that is implemented with single inverter only. The structure can be used as a building block for either NBTI or PBTI sensing scheme, and it can also be employed as a BTI test structure for characterizing N/PBTI and understanding the differences between the two mechanisms.

Fig. 4.24Layout of an example of using sensing element in a 37-stage ring oscillator in 28 nm FD-SOI technology. Overall area is small, and the sensor can be configured to sense either NBTI or PBTI. It can also be used as the test structure for studying N/PBTI degradations



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